An edition of Microelectronics manufacturing and reliability (1993)

Microelectronics manufacturing and reliability

21-22 September 1992, San Jose, California

by

Cover of: Microelectronics manufacturing and reliability by Anant G. Sabnis
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Last edited by MARC Bot
July 23, 2024 | History
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An edition of Microelectronics manufacturing and reliability (1993)

Microelectronics manufacturing and reliability

21-22 September 1992, San Jose, California

by

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Publish Date
Publisher
SPIE
Language
English
Pages
258

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Previews available in: English

Subjects

Testing, Congresses, Integrated circuits, Design and construction, Microelectronics, Reliability
Edition Availability
Cover of: Microelectronics manufacturing and reliability
Microelectronics manufacturing and reliability: 21-22 September 1992, San Jose, California
1993, SPIE
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash
Series
Proceedings / SPIE--the International Society for Optical Engineering ;, v. 1802, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 1802.

Classifications

Dewey Decimal Class
621.3815
Library of Congress
TK7874 .M4838 1993,

The Physical Object

Pagination
x, 258 p. :
Number of pages
258

Edition Identifiers

Open Library
OL1747813M
Internet Archive
microelectronics1802unse
ISBN 10
0819410004
LCCN
92062652
OCLC/WorldCat
27402371
Goodreads
4788975

Work Identifiers

Work ID
OL18960854W

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
Internet Archive item record
marc_columbia MARC record

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July 23, 2024 Edited by MARC Bot import existing book
July 31, 2020 Edited by ImportBot import existing book
February 18, 2019 Created by MARC Bot import existing book