An edition of Microelectronics manufacturing and reliability (1993)

Microelectronics manufacturing and reliability

21-22 September 1992, San Jose, California

by

Cover of: Microelectronics manufacturing and reliability by Anant G. Sabnis
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Last edited by MARC Bot
July 23, 2024 | History
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An edition of Microelectronics manufacturing and reliability (1993)

Microelectronics manufacturing and reliability

21-22 September 1992, San Jose, California

by

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Publish Date
Publisher
SPIE
Language
English
Pages
258

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Previews available in: English

Subjects

Testing, Congresses, Integrated circuits, Design and construction, Microelectronics, Reliability
Edition Availability
Cover of: Microelectronics manufacturing and reliability
Microelectronics manufacturing and reliability: 21-22 September 1992, San Jose, California
1993, SPIE
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash
Series
Proceedings / SPIE--the International Society for Optical Engineering ;, v. 1802, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 1802.

Classifications

Dewey Decimal Class
621.3815
Library of Congress
TK7874 .M4838 1993,

The Physical Object

Pagination
x, 258 p. :
Number of pages
258

Edition Identifiers

Open Library
OL1747813M
Internet Archive
microelectronics1802unse
ISBN 10
0819410004
LCCN
92062652
OCLC/WorldCat
27402371
Goodreads
4788975

Work Identifiers

Work ID
OL18960854W

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
Internet Archive item record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 23, 2024 Edited by MARC Bot import existing book
June 18, 2023 Edited by ImportBot import existing book
November 15, 2020 Edited by MARC Bot import existing book
October 8, 2020 Edited by ImportBot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record