An edition of 1997 IEEE International Conference on Microelectronic Test Structures proceedings
(1997)
1997 IEEE International Conference on Microelectronic Test Structures proceedings
March 17-20, 1997, Monterey, California
by IEEE International Conference on Microel..., Institute of Electrical and Electronics ..., and IEEE Electron Devices Society
Share
×Close
Last edited by Charles Horn
August 26, 2021 | History
This work doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
Subjects
Congresses, Testing, Microelectronics, Integrated circuits, Electronic devices & materials, Engineering measurement & calibration, Electronic Measurements, Technology & Engineering, Technology & Industrial Arts, Science/Mathematics, Electricity, Engineering - Electrical & Electronic, Electronics - Microelectronics| Edition | Availability |
|---|---|
1
1997 IEEE International Conference on Microelectronic Test Structures proceedings: March 17-20, 1997, Monterey, California
1997, IEEE Service Center
in English
0780332431 9780780332430
|
aaaa
|
2
1997 IEEE International Conference on Microelectronics Test Structures Proceedings: March 17-20, 199Y, Monterey, California
April 1997, Institute of Electrical & Electronics Enginee
Paperback
in English
0780332431 9780780332430
|
zzzz
|
Book Details
Edition Notes
"97CH35914."
"97CB35914"--Spine.
Includes bibliographical references and index.
Classifications
The Physical Object
Edition Identifiers
Work Identifiers
Community Reviews (0)
Lists
| August 26, 2021 | Edited by Charles Horn | merge authors |
| July 31, 2019 | Edited by MARC Bot | associate edition with work OL13219202W |
| April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
| January 26, 2010 | Edited by WorkBot | add more information to works |
| December 11, 2009 | Created by WorkBot | add works page |