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IEEE International Conference on Microelectronic Test Structures (1997 Monterey, Calif.)

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1997 IEEE International Conference on Microelectronic Test Structures proceedings: March 17-20, 1997, Monterey, California

by IEEE International Conference on Microel..., Institute of Electrical and Electronics ..., and IEEE Electron Devices Society First published in 1997 — 2 editions

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OLID: OL6126947A

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Created October 29, 2008
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October 29, 2008

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Imported from University of Toronto MARC record