An edition of Characterization, Testing, Measurement, and Metrology
(2020)
Characterization, Testing, Measurement, and Metrology
by Chander Prakash, Sunpreet Singh, and J. Paulo Davim
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| Edition | Availability |
|---|---|
1
Characterization, Testing, Measurement, and Metrology
2020, Taylor & Francis Group
in English
1000193330 9781000193336
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2
Characterization, Testing, Measurement, and Metrology
2020, Taylor & Francis Group
in English
1000193349 9781000193343
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zzzz
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3
Characterization Testing Measurement and Metrology
2020, Taylor & Francis Group
in English
0367275155 9780367275150
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4
Characterization, Testing, Measurement, and Metrology
2020, Taylor & Francis Group
in English
1000193357 9781000193350
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zzzz
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5
Characterization, Testing, Measurement, and Metrology
2020, Taylor & Francis Group
in English
0429298072 9780429298073
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| September 21, 2021 | Created by ImportBot | Imported from Better World Books record |