An edition of Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III
(1996)
Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III
16-17 October 1996, Austin, Texas
by Damon Debusk
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Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III: 16-17 October 1996, Austin, Texas
January 1996, SPIE-International Society for Optical Engine
Hardcover
in English
0819422754 9780819422750
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| August 4, 2024 | Edited by MARC Bot | import existing book |
| November 24, 2020 | Edited by MARC Bot | import existing book |
| April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
| December 11, 2009 | Created by WorkBot | add works page |