An edition of Digital integrated circuit testing from a quality perspective (1993)

Digital integrated circuit testing from a quality perspective

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Cover of: Digital integrated circuit testing from a quality perspective by Hnatek, Eugene R., Hnatek, Eugene R.
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Last edited by Open Library Bot
April 28, 2010 | History
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An edition of Digital integrated circuit testing from a quality perspective (1993)

Digital integrated circuit testing from a quality perspective

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Publish Date
Publisher
Van Nostrand Reinhold
Language
English
Pages
179

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Subjects

Testing, Digital integrated circuits, Quality control
Edition Availability
Cover of: Digital integrated circuit testing from a quality perspective
Digital integrated circuit testing from a quality perspective
1993, Van Nostrand Reinhold
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
New York

Classifications

Dewey Decimal Class
621.3815/48
Library of Congress
TK7874 .H533 1993, TK1-9971

The Physical Object

Pagination
x, 179 p. :
Number of pages
179

Edition Identifiers

Open Library
OL1405514M
ISBN 10
0442006438
LCCN
93013739
OCLC/WorldCat
28111381
LibraryThing
3368794
Goodreads
4894737

Work Identifiers

Work ID
OL3507160W

Source records

Scriblio MARC record
Library of Congress MARC record
Library of Congress MARC record
Better World Books record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
February 14, 2010 Edited by WorkBot add more information to works
December 10, 2009 Created by WorkBot add works page