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Subjects
Complementary Metal oxide semiconductors, Congresses, Iddq testing, Metal oxide semiconductors, Complementary, Testing, General Theory of Computing, Storage media & peripherals, Digital Computer Hardware, Computers, Technology & Industrial Arts, Science/Mathematics, General, Logic Design, Computer Engineering, Metal oxide semiconductors, CoEdition | Availability |
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1
IEEE International Workshop on IDDQ Testing: digest of papers, November 5-6, 1997, Washington, D.C.
1997, IEEE Computer Society Press
in English
0818681233 9780818681233
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2
IEEE International Workshop on IDDQ Testing: Digest of papers, November 5-6, 1997, Washington, D.C
1997, IEEE Computer Society Press
Unknown Binding
in English
081868125X 9780818681257
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3
IEEE International Workshop on Iddq Testing: November 5-6, 1997, Washington, D.C. : Digest of Papers
November 1997, Institute of Electrical & Electronics Enginee
Paperback
in English
0818681233 9780818681233
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Book Details
Edition Notes
Includes bibliographic references and index.
"IEEE Computer Society order number PR08123"--T.p. verso.
"IEEE order plan catalog number 97TB100169"--T.p. verso.
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July 31, 2019 | Edited by MARC Bot | associate edition with work OL2769314W |
December 4, 2010 | Edited by Open Library Bot | Added subjects from MARC records. |
April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
February 6, 2010 | Edited by WorkBot | add more information to works |
December 10, 2009 | Created by WorkBot | add works page |