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×CloseOptical diagnostic methods for inorganic materials III: 6-7 August, 2003, San Diego, California, USA
Subjects
Analysis, Congresses, Inorganic compounds, Optical measurements, Optical properties, Refractive index, Materials, Reflectance, Surfaces, Testing, Engineering, Materials, testing, Optical data processing, Optical materials, Reflectance spectroscopy, Surfaces (Technology), Thin filmsID Numbers
- OLID: OL8613228A
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