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Bruno Ciciani

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Tutorial on manufacturing yield evaluation of VLSI/WSI systems

by Bruno Ciciani First published in 1994 — 2 editions

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Manufacturing Yield Evaluation of Vlsi/Wsi Systems

by Bruno Ciciani First published in 1995 — 1 edition

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Cloud Computing: First International Conference, CloudComp 2009, Munich, Germany, October 19-21, 2009, Revised Selected Papers

by Dimiter Avresky, Michel Diaz, Arndt Bode, Bruno Ciciani, and Eliezer Dekel First published in 2011 — 1 edition

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OLID: OL3616752A

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Created April 30, 2008
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