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Congresses, Numerical analysis, Semiconductors, Mathematical models, Boundary layer, Boundary value problems, Integrated circuits, Design and construction, Numerical solutions, Problèmes aux limites, Anfangswertproblem, Asymptotes, Computer simulation, Couche limite, Data processing, Differentialgleichung, Electronic industries, Elliptic Differential equations, Finite element method, Fluid dynamics, Initial value problems, Kongreß, Numerisches Verfahren, Problèmes aux valeurs initiales, RandwertproblemID Numbers
- OLID: OL2647860A
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April 29, 2008 | Created by an anonymous user | initial import |